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Description: Conventional AFM system – DimensionIcon (Bruker, USA) major technical characteristics: Scanner parameters: maximum scanning (XY) area 90 µm, Z range 10 µm.

Available measurement methods: tapping mode, contact mode. Imaging: phase imaging, lateral force microscopy, force modulating, electrical field microscopy, magnetic force microscopy, piezoresponse force microscopy.
Major areas of application: Surface analysis of solids, biomolecules, cell cultures in water or air. Single molecule or cell manipulation for their properties investigation.


https://www.bruker.com/products/surface-and-dimensional-analysis/atomic-force-microscopes/dimension-icon/overview.html

On-site training available: yes
Qualified users only are permitted to operate this equipment: yes
Personal user assistant available: yes

VU ID:8042983
Room: C462

Contact Scientist:

Dr. Marija Jankunec
+370 5 223 4400

 

8 Jankunec AFM dimensioncon

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