Description: Conventional AFM system – DimensionIcon (Bruker, USA) major technical characteristics: scanner parameters: maximum scanning (XY) area 90 µm, Z range 10 µm. Available measurement methods: tapping mode, contact mode. Imaging: phase imaging, lateral force microscopy, force modulating, electrical field microscopy, magnetic force microscopy, piezoresponse force microscopy.

Major areas of application: surface analysis of solids, biomolecules, cell cultures in water or air. Single molecule or cell manipulation for their properties investigation.

https://www.bruker.com/products/surface-and-dimensional-analysis/atomic-force-microscopes/dimension-icon/overview.html

On-site training available: yes
Qualified users only are permitted to operate this equipment: yes
Personal user assistant available: yes

VU ID: 8042983
Room: C462
Dept.: LSC IBCh

Contact Scientist:

Dr Marija Jankunec
+370 5 223 4400