Description: Conventional AFM system – DimensionIcon (Bruker, USA) major technical characteristics: Scanner parameters: maximum scanning (XY) area 90 µm, Z range 10 µm.
Available measurement methods: tapping mode, contact mode. Imaging: phase imaging, lateral force microscopy, force modulating, electrical field microscopy, magnetic force microscopy, piezoresponse force microscopy.
Major areas of application: Surface analysis of solids, biomolecules, cell cultures in water or air. Single molecule or cell manipulation for their properties investigation.
On-site training available: yes
Qualified users only are permitted to operate this equipment: yes
Personal user assistant available: yes